See the Presentations from PVSC IEEE 2025

June 9-12, 2025.

The Kiwa PVEL team attended the PVSC IEEE 53 Conference in Montreal, Quebec. During the show, Dr. Arcahna Sinha presented on  "UV-Induced Degradation in N-Type TOPCon Modules: Exploring Metastability and Recovery Pathways" outlining how certain n‑type TOPCon modules suffer significant performance drops under high-intensity UV exposure.

Click here to view the presentation. 

On the final day of the conference, she prestened on "Understanding Solar Module Test Failures: Key Takeaways from Kiwa PVEL’s PV Module Reliability Scorecard" speaking about  the recent insights from our 2025 Scorecard.